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  ? semiconductor components industries, llc, 2001 january, 2001 rev. 5 1 publication order number: cs1124/d cs1124 dual variable-reluctance sensor interface ic the cs1124 is a monolithic integrated circuit designed primarily to condition signals used to monitor rotating parts. the cs1124 is a dual channel device. each channel interfaces to a variable reluctance sensor, and monitors the signal produced when a metal object is moved past that sensor. an output is generated that is a comparison of the input voltage and the voltage produced at the in adj lead. the resulting squarewave is available at the out pin. when the diag pin is high, the reference voltage at in adj is increased. this then requires a larger signal at the input to trip the comparator, and provides for a procedure to test for an open sensor. features ? dual channel capability ? builtin test mode ? onchip input voltage clamping ? works from 5.0 v supply ? accurate builtin hysteresis figure 1. block diagram out1 to m p v cc v cc v cc v cc v cc inp1 in adj diag in1 c1 r1 r rs v rs variable reluctance sensor + comp1 active clamp v cc v cc inp2 in2 c2 r2 r rs v rs variable reluctance sensor + comp2 active clamp out2 to m p r adj gnd http://onsemi.com device package shipping ordering information cs1124yd8 so8 95 units/rail cs1124ydr8 so8 2500 tape & reel so8 d suffix case 751 a = assembly location wl, l = wafer lot yy, y = year ww, w = work week diag gnd 1 1124 alywx 8 out2 in2 out1 in1 v cc in adj pin connections and marking diagram 1 8
cs1124 http://onsemi.com 2 absolute maximum ratings* rating value unit storage temperature range 65 to 150 c ambient operating temperature 40 to 125 c supply voltage range (continuous) 0.3 to 7.0 v input voltage range (at any input, r1 = r2 = 22 k) 250 to 250 v maximum junction temperature 150 c esd susceptibility (human body model) 2.0 kv lead temperature soldering: reflow: (smd styles only) (note 1.) 230 peak c 1. 60 second maximum above 183 c. *the maximum package power dissipation must be observed. electrical characteristics (4.5 v < v cc < 5.5 v, 40 c < t a < 125 c, v diag = 0; unless otherwise specified.) characteristic test conditions min typ max unit v cc supply operating current supply v cc = 5.0 v 5.0 ma sensor inputs input threshold positive v diag = low v diag = high 135 135 160 160 185 185 mv mv input threshold negative v diag = low v diag = high 185 135 160 160 135 185 mv mv input bias current (inp1, inp2) v in = 0.336 v 16 11 6.0 m a input bias current (diag) v diag = 0 v 1.0 m a input bias current factor (k i ) (in adj = inp k i ) v in = 0.336 v, v diag = low v in = 0.336 v, v diag = high 152 100 155 157 %inp %inp bias current matching inp1 or inp2 to in adj , v in = 0.336 v 1.0 0 1.0 m a input clamp negative i in = 50 m a i in = 12 ma 0.5 0.5 0.25 0.30 0 0 v v input clamp positive i in = +12 ma 5.0 7.0 9.0 v output low voltage i out = 1.6 ma 0.2 0.4 v output high voltage i out = 1.6 ma v cc 0.5 v cc 0.2 v mode change time delay 0 20 m s input to output delay i out = 1.0 ma 1.0 20 m s output rise time c load = 30 pf 0.5 2.0 m s output fall time c load = 30 pf 0.05 2.0 m s opensensor positive threshold v diag = high, r in(adj) = 40 k. note 2. 29.4 54 86.9 k w logic inputs diag input low threshold 0.2 v cc v diag input high threshold 0.7 v cc v diag input resistance v in = 0.3 v cc , v cc = 5.0 v v in = v cc , v cc = 5.0 v 8.0 8.0 22 22 70 70 k w k w 2. this parameter is guaranteed by design, but not parametrically tested in production.
cs1124 http://onsemi.com 3 package pin description* package pin # so8 pin symbol function 1 in adj external resistor to ground that sets the trip levels of both channels. functions for both diagnostic and normal mode. 2 in1 input to channel 1. 3 in2 input to channel 2. 4 gnd ground. 5 diag diagnostic mode switch. normal mode is low. 6 out2 output of channel 2. 7 out1 output of channel 1. 8 v cc positive 5.0 volt supply input. out1 to m p v cc v cc v cc v cc v cc inp1 in adj diag in1 c1 r1 r rs v rs variable reluctance sensor + comp1 active clamp r adj gnd figure 2. application diagram theory of operation normal operation figure 2 shows one channel of the cs1124 along with the necessary external components. both channels share the in adj pin as the negative input to a comparator. a brief description of the components is as follows: v rs ideal sinusoidal, ground referenced, sensor output amplitude usually increases with frequency, depending on loading. r rs source impedance of sensor. r1/r adj external resistors for current limiting and biasing. inp1/in adj internal current sources that determine trip points via r1/r adj . comp1 internal comparator with builtin hysteresis set at 160 mv. out1 output 0 v 5.0 v square wave with the same frequency as v rs . by inspection, the voltage at the (+) and () terminals of comp1 with v rs = 0v are: v +  inp1(r1  r rs ) (1)
cs1124 http://onsemi.com 4 v  in adj  r adj (2) as v rs begins to rise and fall, it will be superimposed on the dc biased voltage at v + . v +  inp1(r1  r rs )  v rs (3) to get comparator comp1 to trip, the following condition is needed when crossing in the positive direction, v +  v  v hys (4) (v hys is the builtin hysteresis set to 160 mv), or when crossing in the negative direction, v +  v  v hys (5) combining equations 2, 3, and 4, we get: inp1(r1  r rs )  v rs  in adj  r adj  v hys (6) therefore, v rs(+trp)  in adj  r adj  inp1(r1  r rs )  v hys (7) it should be evident that tripping on the negative side is: v rs(trp)  in adj  r adj  inp1(r1  r rs )  v hys (8) in normal mode, inp1  in adj (9) we can now rewrite equation (7) as: v rs(+tr)  inp1(r adj  r1  r rs )  v hys (10) by making r adj  r1  r rs (11) you can detect signals with as little amplitude as v hys . a design example is given in the applications section. open sensor protection the cs1124 has a diag pin that when pulled high (5.0 v), will increase the in adj current source by roughly 50%. equation (7) shows that a larger v rs(+trp) voltage will be needed to trip comparator comp1. however, if no v rs signal is present, then we can use equations 1, 2, and 4 (equation 5 does not apply in this mode) to get: inp1(r1  r rs )  inp1  k i  r adj  v hys (12) since r rs is the only unknown variable we can solve for r rs , r rs  inp1  k i  r adj  v hys inp1  r1 (13) equation (13) shows that if the output switches states when entering the diag mode with v rs = 0, the sensor impedance must be greater than the above calculated value. this can be very useful in diagnosing intermittent sensor. input protection as shown in figure 2, an active clamp is provided on each input to limit the voltage on the input pin and prevent substrate current injection. the clamp is specified to handle 12 ma. this puts an upper limit on the amplitude of the sensor output. for example, if r1 = 20 k, then v rs(max)  20 k  12 ma  240 v therefore, the v rs(pkpk) voltage can be as high as 480 v. the cs1124 will typically run at a frequency up to 1.8 mhz if the input signal does not activate the positive or negative input clamps. frequency performance will be lower when the positive or negative clamps are active. typical performance will be up to a frequency of 680 khz with the clamps active.
cs1124 http://onsemi.com 5 circuit description figure 3 shows the part operating near the minimum input thresholds. as the sin wave input threshold is increased, the low side clamps become active (figure 4). increasing the amplitude further (figure 5), the highside clamp becomes active. these internal clamps allow for voltages up to 250 v and 250 v on the sensor side of the setup (with r1 = r2 = 22 k) (reference the diagram page 1). figure 6 shows the effect using the diagnostic (diag) function has on the circuit. the input threshold (negative) is switched from a threshold of 160 mv to +160 mv when diag goes from a low to a high. there is no hysteresis when diag is high. figure 3. minimum threshold operation in1, 200 mv/div out1, 2.0 v/div 20 ms/div figure 4. lowside clamp in1, 5.0 v/div out1, 2.0 v/div 20 ms/div figure 5. low and highside clamps in1, 5.0 v/div out1, 2.0 v/div 20 ms/div figure 6. diagnostic operation diag 5.0 v/div 20 ms/div in1 1.0 v/div out1 5.0 v/div
cs1124 http://onsemi.com 6 application information referring to figure 2, the following will be a design example given these system requirements: r rs  1.5 k  (  12 k  is considered open) v rs(max)  120 v pk v rs(min)  250 mv pk f vrs  10 khz @ v rs(min)  40 v pkpk 1. determine tradeoff between r1 value and power rating. (use 1/2 watt package) p d  120 2 2 r1  1  2w set r1 = 15 k. (the clamp current will then be 120/15 k = 8.0 ma, which is less than the 12 ma limit.) 2. determine r adj set r adj as close to r1 + r rs as possible. therefore, r adj = 17 k. 3. determine v rs(+trp) using equation (7). v rs(+trp)  11  a  17k  11  a(15k  1.5k)  160 mv v rs(+trp)  166 mv typical (easily meets 250 mv minimum) 4. calculate worst case v rs(+trp) examination of equation (7) and the spec reveals the worst case trip voltage will occur when: v hys = 180 mv in adj = 16 m a inp1 = 15 m a r1 = 14.25 k (5% low) r adj = 17.85 k (5% high) v rs(+)max  16  a(17.85 k)  15  a(14.25 k  1.5 k)  180 mv  229 mv which is still less than the 250 mv minimum amplitude of the input. 5. calculate c1 for low pass filtering since the sensor guarantees 40 v pkpk @ 10 khz, a low pass filter using r1 and c1 can be used to eliminate high frequency noise without affecting system performance. gain reduction  0.29 v 20 v  0.0145  36.7 db therefore, a cutoff frequency, f c , of 145 hz could be used. c1  1 2  f c r1  0.07  f set c1 = 0.047 m f. 6. calculate the minimum r rs that will be indicated as an open circuit. (diag = 5.0 v) rearranging equation (7) gives r rs  v hys  [inp1  k i  r adj ]  v rs(+trp)
inp1  r1 but, v rs = 0 during this test, so it drops out. using the following as worst case low and high: worst case low (r rs ) worst case high (r rs ) in adj 23.6 m a = 15 m a 1.57 10.7 m a = 7.0 m a 1.53 r adj 16.15 k 17.85 k v hys 135 mv 185 mv inp1 16 m a 6.0 m a r1 15.75 k 14.25 k k i 1.57 1.53 r rs  135 mv  23.6  a  16.15 k 16  a  15.75 k  16.5 k therefore, r rs(min)  16.5 k (meets 12 k system spec) and, r rs(max)  185 mv  10.7  a  17.85 k 6.0  a  14.25 k  48.4 k
cs1124 http://onsemi.com 7 package dimensions so8 d suffix case 75107 issue v seating plane 1 4 5 8 n j x 45  k notes: 1. dimensioning and tolerancing per ansi y14.5m, 1982. 2. controlling dimension: millimeter. 3. dimension a and b do not include mold protrusion. 4. maximum mold protrusion 0.15 (0.006) per side. 5. dimension d does not include dambar protrusion. allowable dambar protrusion shall be 0.127 (0.005) total in excess of the d dimension at maximum material condition. a b s d h c 0.10 (0.004) x y g m y m 0.25 (0.010) z y m 0.25 (0.010) z s x s m package thermal data parameter so8 unit r q jc typical 45 c/w r q ja typical 165 c/w
cs1124 http://onsemi.com 8 on semiconductor and are trademarks of semiconductor components industries, llc (scillc). scillc reserves the right to make changes without further notice to any products herein. scillc makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does scillc assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. atypicalo parameters which may be provided in scill c data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. all operating parameters, including atypicalso must be validated for each customer application by customer's technical experts. scillc does not convey any license under its patent rights nor the rights of others. scillc products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body , or other applications intended to support or sustain life, or for any other application in which the failure of the scillc product could create a sit uation where personal injury or death may occur. should buyer purchase or use scillc products for any such unintended or unauthorized application, buyer shall indemnify and hold scillc and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthori zed use, even if such claim alleges that scillc was negligent regarding the design or manufacture of the part. scillc is an equal opportunity/affirmative action employer. publication ordering information central/south america: spanish phone : 3033087143 (monfri 8:00am to 5:00pm mst) email : onlitspanish@hibbertco.com asia/pacific : ldc for on semiconductor asia support phone : 3036752121 (tuefri 9:00am to 1:00pm, hong kong time) toll free from hong kong & singapore: 00180044223781 email : onlitasia@hibbertco.com japan : on semiconductor, japan customer focus center 4321 nishigotanda, shinagawaku, tokyo, japan 1410031 phone : 81357402745 email : r14525@onsemi.com on semiconductor website : http://onsemi.com for additional information, please contact your local sales representative. cs1124/d north america literature fulfillment : literature distribution center for on semiconductor p.o. box 5163, denver, colorado 80217 usa phone : 3036752175 or 8003443860 toll free usa/canada fax : 3036752176 or 8003443867 toll free usa/canada email : onlit@hibbertco.com fax response line: 3036752167 or 8003443810 toll free usa/canada n. american technical support : 8002829855 toll free usa/canada europe: ldc for on semiconductor european support german phone : (+1) 3033087140 (monfri 2:30pm to 7:00pm cet) email : onlitgerman@hibbertco.com french phone : (+1) 3033087141 (monfri 2:00pm to 7:00pm cet) email : onlitfrench@hibbertco.com english phone : (+1) 3033087142 (monfri 12:00pm to 5:00pm gmt) email : onlit@hibbertco.com european tollfree access*: 0080044223781 *available from germany, france, italy, uk, ireland


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